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business discussion
SEMI MF1708 — Practice for Evaluation of Granular Polysilicon by Melter-Zoner Spectroscopies
Detail configuration requirements for each are shown in Table 2
本方法は，
SEMI D22で測定されたFPDカラーフィルタの色特性を示すデータを用いて，カラーフィルタの色表現を評価する方法に関するガイドである。
M07300 - SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles Revision:SEMI M73-0125 - Current business discussion1 Purpose 1. 1 SEMI M1 specifies the contour of the shaped edge of silicon wafers by using templates that allow a wide variation in wafer edge profiles manufactured by silicon suppliers to still meet the specification. 1. 2 In many advanced wafer applications, a much tighter specification of the edge profile is required to control variations in subsequent circuit processing. These specifications frequently include values for certain characteristics
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