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SEMI P22 — Guideline for Photomask Defect Classification And Size Definition
SEMI E54-0704 (technical revision)
2 The GEM Standard is intended to specify the following:
5-0302 (Reapproved 0308)
but are common across multiple standards
Semiconductor Device & Assembly Manufacturing 7/21/26 StdTpc-FPD Metrology SEMI P22 — Guideline forSemiconductor Device & Assembly Manufacturing US EU Dates & Times July 21st July 23rd 8: 00 AM 12: 00 PM PST Location Webinar Pricing Early Bird $100 Members: $699 $599 Non Members: $749 $649 The Semiconductor Device and Assembly Manufacturing workshop is a 12 hour webinar that is held for 4 over three days. This three day workshop provides a complete overview of the semiconductor manufacturing process. The class focuses on key process steps needed to